Marco Rigamonti, Piero Baraldi, Allegra Alessi, Enrico Zio, Daniel Astigarraga, Ainhoa Galarza. An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors. IEEE Transactions on Reliability, 67(3):1304-1313, 2018. [doi]
@article{RigamontiBAZAG18,
title = {An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors},
author = {Marco Rigamonti and Piero Baraldi and Allegra Alessi and Enrico Zio and Daniel Astigarraga and Ainhoa Galarza},
year = {2018},
doi = {10.1109/TR.2018.2834828},
url = {https://doi.org/10.1109/TR.2018.2834828},
researchr = {https://researchr.org/publication/RigamontiBAZAG18},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {67},
number = {3},
pages = {1304-1313},
}