Marco Rigamonti, Piero Baraldi, Allegra Alessi, Enrico Zio, Daniel Astigarraga, Ainhoa Galarza. An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors. IEEE Transactions on Reliability, 67(3):1304-1313, 2018. [doi]
Abstract is missing.