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Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga. From specification to measurement: the bottleneck in analog industrial testing. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 177-182, IEEE Computer Society, 1990. [doi]

This author has not been identified. Look up 'Robert Van Rijsinge' in GoogleThis author has not been identified. Look up 'A. A. R. M. Haggenburg' in GoogleThis author has not been identified. Look up 'C. de Vries' in GoogleThis author has not been identified. Look up 'Hans Wallinga' in Google

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