Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga. From specification to measurement: the bottleneck in analog industrial testing. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 177-182, IEEE Computer Society, 1990. [doi]
@inproceedings{RijsingeHVW90,
title = {From specification to measurement: the bottleneck in analog industrial testing},
author = {Robert Van Rijsinge and A. A. R. M. Haggenburg and C. de Vries and Hans Wallinga},
year = {1990},
doi = {10.1109/TEST.1990.114016},
url = {http://dx.doi.org/10.1109/TEST.1990.114016},
researchr = {https://researchr.org/publication/RijsingeHVW90},
cites = {0},
citedby = {0},
pages = {177-182},
booktitle = {Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990},
publisher = {IEEE Computer Society},
isbn = {0-8186-9064-},
}