A reliability analysis of Double-Ring topologies with Dual Attachment using p-cycles for optical metro networks

P. M. Santiago del Río, J. A. Hernández, Javier Aracil, Jorge E. López de Vergara, Jerzy Domzal, Robert Wójcik, Piotr Cholda, Krzysztof Wajda, Juan P. Fernández Palacios, Óscar González de Dios, Raúl Duque. A reliability analysis of Double-Ring topologies with Dual Attachment using p-cycles for optical metro networks. Computer Networks, 54(8):1328-1341, 2010. [doi]

Abstract

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