Romain Ritzenthaler, Tom Schram, Geert Eneman, Anda Mocuta, Naoto Horiguchi, Aaron Voon-Yew Thean, Alessio Spessot, Marc Aoulaiche, Pierre Fazan, K. B. Noh, Y. Son. Assessment of SiGe quantum well transistors for DRAM peripheral applications. In 2015 International Conference on IC Design & Technology, ICICDT 2015, Leuven, Belgium, June 1-3, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{RitzenthalerSEM15,
title = {Assessment of SiGe quantum well transistors for DRAM peripheral applications},
author = {Romain Ritzenthaler and Tom Schram and Geert Eneman and Anda Mocuta and Naoto Horiguchi and Aaron Voon-Yew Thean and Alessio Spessot and Marc Aoulaiche and Pierre Fazan and K. B. Noh and Y. Son},
year = {2015},
doi = {10.1109/ICICDT.2015.7165875},
url = {http://dx.doi.org/10.1109/ICICDT.2015.7165875},
researchr = {https://researchr.org/publication/RitzenthalerSEM15},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2015 International Conference on IC Design & Technology, ICICDT 2015, Leuven, Belgium, June 1-3, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7669-0},
}