David Roberts, Todd M. Austin, David Blaauw, Trevor N. Mudge, Krisztián Flautner. Error Analysis for the Support of Robust Voltage Scaling. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 65-70, IEEE Computer Society, 2005. [doi]
Abstract is missing.