Riley Roberts, Benjamin Lewis, Arnd Hartmanns, Prabal Basu, Sanghamitra Roy, Koushik Chakraborty, Zhen Zhang 0006. Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System. In Alberto Lluch-Lafuente, Anastasia Mavridou, editors, Formal Methods for Industrial Critical Systems - 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021, Proceedings. Volume 12863 of Lecture Notes in Computer Science, pages 232-248, Springer, 2021. [doi]
@inproceedings{RobertsLHBRCZ21,
title = {Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System},
author = {Riley Roberts and Benjamin Lewis and Arnd Hartmanns and Prabal Basu and Sanghamitra Roy and Koushik Chakraborty and Zhen Zhang 0006},
year = {2021},
doi = {10.1007/978-3-030-85248-1_16},
url = {https://doi.org/10.1007/978-3-030-85248-1_16},
researchr = {https://researchr.org/publication/RobertsLHBRCZ21},
cites = {0},
citedby = {0},
pages = {232-248},
booktitle = {Formal Methods for Industrial Critical Systems - 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021, Proceedings},
editor = {Alberto Lluch-Lafuente and Anastasia Mavridou},
volume = {12863},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-85248-1},
}