Riley Roberts, Benjamin Lewis, Arnd Hartmanns, Prabal Basu, Sanghamitra Roy, Koushik Chakraborty, Zhen Zhang 0006. Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System. In Alberto Lluch-Lafuente, Anastasia Mavridou, editors, Formal Methods for Industrial Critical Systems - 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021, Proceedings. Volume 12863 of Lecture Notes in Computer Science, pages 232-248, Springer, 2021.
Abstract is missing.