Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage - researchr publication

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Alexandre Le Roch, Vincent Goiffon, Olivier Marcelot, Philippe Paillet, Federico Pace, Jean-Marc Belloir, Pierre Magnan, Cédric Virmontois. Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors, 19(24):5550, 2019. [doi]

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