Allana Rocha, Bruno J. T. Fernandes, Leandro H. de S. Silva. Evaluation of Deep Learning Model for Detecting Electronic Components in Few-Shot Learning Scenarios. In IEEE Latin American Conference on Computational Intelligence, LA-CCI 2023, Recife, PE, Brazil, October 29 - November 1, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.