Steffen Rochel, Hidetoshi Onodera. Substrate and phase noise characterization. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 448-449, IEEE, 2005. [doi]
@inproceedings{RochelO05,
title = {Substrate and phase noise characterization},
author = {Steffen Rochel and Hidetoshi Onodera},
year = {2005},
doi = {10.1109/CICC.2005.1568704},
url = {http://dx.doi.org/10.1109/CICC.2005.1568704},
researchr = {https://researchr.org/publication/RochelO05},
cites = {0},
citedby = {0},
pages = {448-449},
booktitle = {Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005},
publisher = {IEEE},
isbn = {0-7803-9023-7},
}