Rance Rodrigues, Israel Koren, Sandip Kundu. An Architecture to Enable Life Cycle Testing in CMPs. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 341-348, IEEE, 2011. [doi]
Abstract is missing.