Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test - researchr publication authors

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Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira. Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 281-286, IEEE Computer Society, 2005. [doi]

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