Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas. Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-7, IEEE, 2020. [doi]
@inproceedings{RodriguezCMNAMB20,
title = {Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation},
author = {Rosana Rodríguez and Albert Crespo-Yepes and Javier Martín-Martínez and Montserrat Nafría and Xavier Aragonès and Diego Mateo and Enrique Barajas},
year = {2020},
doi = {10.1109/IRPS45951.2020.9129301},
url = {https://doi.org/10.1109/IRPS45951.2020.9129301},
researchr = {https://researchr.org/publication/RodriguezCMNAMB20},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}