Exploring Total Ionizing Dose Radiation Effects Across Generations of NVIDIA Jetson Devices: A Comparative Analysis

Ivan Rodriguez-Ferrandez, Maris Tali, Leonidas Kosmidis, Alessandra Costantino, David Steenari. Exploring Total Ionizing Dose Radiation Effects Across Generations of NVIDIA Jetson Devices: A Comparative Analysis. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, Didcot, United Kingdom, October 8-10, 2024. pages 1-6, IEEE, 2024. [doi]

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