Clemente Rodríguez, Javier Muguerza, M. Navarro, A. Zárate, José Ignacio Martín, Jesús M. Pérez. A two-stage classifier for broken and blurred digits in forms. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 1101-1105, IEEE, 1998. [doi]
Abstract is missing.