Jeffrey L. Roehr. Measurement ratio testing for improved quality and outlier detection. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
@inproceedings{Roehr07,
title = {Measurement ratio testing for improved quality and outlier detection},
author = {Jeffrey L. Roehr},
year = {2007},
doi = {10.1109/TEST.2007.4437616},
url = {http://dx.doi.org/10.1109/TEST.2007.4437616},
researchr = {https://researchr.org/publication/Roehr07},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}