Jeffrey L. Roehr. Measurement ratio testing for improved quality and outlier detection. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
No references recorded for this publication.
No citations of this publication recorded.