Alec Roelke, Mircea R. Stan. Controlling the Reliability of SRAM PUFs With Directed NBTI Aging and Recovery. IEEE Trans. VLSI Syst., 26(10):2016-2026, 2018. [doi]
@article{RoelkeS18,
title = {Controlling the Reliability of SRAM PUFs With Directed NBTI Aging and Recovery},
author = {Alec Roelke and Mircea R. Stan},
year = {2018},
doi = {10.1109/TVLSI.2018.2836154},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2836154},
researchr = {https://researchr.org/publication/RoelkeS18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {26},
number = {10},
pages = {2016-2026},
}