A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test - researchr publication authors

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Jeongjin Roh, Jacob A. Abraham. A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 143-148, IEEE Computer Society, 2000. [doi]

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