Jeongjin Roh, Jacob A. Abraham. A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 143-148, IEEE Computer Society, 2000. [doi]
@inproceedings{RohA00,
title = {A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test},
author = {Jeongjin Roh and Jacob A. Abraham},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130143abs.htm},
tags = {rule-based, testing, analysis},
researchr = {https://researchr.org/publication/RohA00},
cites = {0},
citedby = {0},
pages = {143-148},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}