Blaz Rolih, Dick Ameln, Ashwin Vaidya, Samet Akcay. Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Workshops, Seattle, WA, USA, June 17-18, 2024. pages 3866-3875, IEEE, 2024. [doi]
Abstract is missing.