Marco Rona, Gunter Krampl. A VHDL-based virtual test concept for pre-silicon test-program debug. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 135-139, IEEE Computer Society, 2001. [doi]
@inproceedings{RonaK01-0, title = {A VHDL-based virtual test concept for pre-silicon test-program debug}, author = {Marco Rona and Gunter Krampl}, year = {2001}, doi = {10.1109/ETW.2001.946679}, url = {https://doi.org/10.1109/ETW.2001.946679}, researchr = {https://researchr.org/publication/RonaK01-0}, cites = {0}, citedby = {0}, pages = {135-139}, booktitle = {6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001}, publisher = {IEEE Computer Society}, isbn = {0-7695-1017-5}, }