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Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test

N. Ronchi, Franco Zanon, A. Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso. Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. Microelectronics Reliability, 49(9-11):1207-1210, 2009. [doi]

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