David E. Root, John Wood, Nick Tufillaro. New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 85-90, ACM, 2003. [doi]
@inproceedings{RootWT03,
title = {New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements},
author = {David E. Root and John Wood and Nick Tufillaro},
year = {2003},
doi = {10.1145/775832.775856},
url = {http://doi.acm.org/10.1145/775832.775856},
tags = {modeling, e-science},
researchr = {https://researchr.org/publication/RootWT03},
cites = {0},
citedby = {0},
pages = {85-90},
booktitle = {Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003},
publisher = {ACM},
isbn = {1-58113-688-9},
}