Gert-Jan van Rootselaar, Bart Vermeulen. Silicon debug: scan chains alone are not enough. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 892-902, IEEE Computer Society, 1999.
@inproceedings{RootselaarV99,
title = {Silicon debug: scan chains alone are not enough},
author = {Gert-Jan van Rootselaar and Bart Vermeulen},
year = {1999},
tags = {debugging},
researchr = {https://researchr.org/publication/RootselaarV99},
cites = {0},
citedby = {0},
pages = {892-902},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}