Impact of dynamic voltage scaling and thermal factors on SRAM reliability - researchr publication authors

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Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Luciano Ost, Ricardo Reis. Impact of dynamic voltage scaling and thermal factors on SRAM reliability. Microelectronics Reliability, 55(9-10):1486-1490, 2015. [doi]

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