Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Luciano Ost, Ricardo Reis. Impact of dynamic voltage scaling and thermal factors on SRAM reliability. Microelectronics Reliability, 55(9-10):1486-1490, 2015. [doi]
@article{RosaBWKOR15,
title = {Impact of dynamic voltage scaling and thermal factors on SRAM reliability},
author = {Felipe Rosa and Raphael Martins Brum and Gilson I. Wirth and Fernanda Gusmão de Lima Kastensmidt and Luciano Ost and Ricardo Reis},
year = {2015},
doi = {10.1016/j.microrel.2015.07.013},
url = {http://dx.doi.org/10.1016/j.microrel.2015.07.013},
researchr = {https://researchr.org/publication/RosaBWKOR15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1486-1490},
}