Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Luciano Ost, Ricardo Reis. Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 137-140, IEEE, 2015. [doi]
@inproceedings{RosaBWOR15,
title = {Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability},
author = {Felipe Rosa and Raphael Martins Brum and Gilson I. Wirth and Luciano Ost and Ricardo Reis},
year = {2015},
doi = {10.1109/ICECS.2015.7440268},
url = {http://dx.doi.org/10.1109/ICECS.2015.7440268},
researchr = {https://researchr.org/publication/RosaBWOR15},
cites = {0},
citedby = {0},
pages = {137-140},
booktitle = {2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015},
publisher = {IEEE},
isbn = {978-1-5090-0246-7},
}