Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach

Francisco López de la Rosa, José L. Gómez-Sirvent, Corinna Kofler, Rafael Morales 0001, Antonio Fernández-Caballero 0001. Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach. In José Manuel Ferrández de Vicente, José Ramón Álvarez Sánchez, Félix de la Paz López, Hojjat Adeli, editors, Bio-inspired Systems and Applications: from Robotics to Ambient Intelligence - 9th International Work-Conference on the Interplay Between Natural and Artificial Computation, IWINAC 2022, Puerto de la Cruz, Tenerife, Spain, May 31 - June 3, 2022, Proceedings, Part II. Volume 13259 of Lecture Notes in Computer Science, pages 356-365, Springer, 2022. [doi]

Abstract

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