Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network

Francisco López de la Rosa, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales 0001, Antonio Fernández-Caballero 0001. Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network. Expert Syst. Appl., 206:117731, 2022. [doi]

Abstract

Abstract is missing.