Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework - researchr publication authors

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Raffaele De Rose, Greta Carangelo, Marco Lanuzza, Felice Crupi, Giovanni Finocchio, Mario Carpentieri. Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework. In 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017, Giardini Naxos, Italy, June 12-15, 2017. pages 1-4, IEEE, 2017. [doi]

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