Raffaele De Rose, Greta Carangelo, Marco Lanuzza, Felice Crupi, Giovanni Finocchio, Mario Carpentieri. Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework. In 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017, Giardini Naxos, Italy, June 12-15, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{RoseCLCFC17,
title = {Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework},
author = {Raffaele De Rose and Greta Carangelo and Marco Lanuzza and Felice Crupi and Giovanni Finocchio and Mario Carpentieri},
year = {2017},
doi = {10.1109/SMACD.2017.7981583},
url = {https://doi.org/10.1109/SMACD.2017.7981583},
researchr = {https://researchr.org/publication/RoseCLCFC17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017, Giardini Naxos, Italy, June 12-15, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5052-9},
}