Power profile manipulation: a new approach for reducing test application time under power constraints

Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nicolici. Power profile manipulation: a new approach for reducing test application time under power constraints. IEEE Trans. on CAD of Integrated Circuits and Systems, 21(10):1217-1225, 2002. [doi]

@article{RosingerAN02:1,
  title = {Power profile manipulation: a new approach for reducing test application time under power constraints},
  author = {Paul M. Rosinger and Bashir M. Al-Hashimi and Nicola Nicolici},
  year = {2002},
  doi = {10.1109/TCAD.2002.802256},
  url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2002.802256},
  tags = {testing, constraints, systematic-approach},
  researchr = {https://researchr.org/publication/RosingerAN02%3A1},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {21},
  number = {10},
  pages = {1217-1225},
}