Early Detection of Design Sensitivities that Cause Yield Loss for New Products - researchr publication authors

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Ron Ross, Keith McCasland. Early Detection of Design Sensitivities that Cause Yield Loss for New Products. In 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. pages 427-430, IEEE Computer Society, 2001. [doi]

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