Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs

Isabella Rossetto, Matteo Meneghini, Davide Bisi, A. Barbato, Marleen Van Hove, Denis Marcon, Tian-Li Wu, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni. Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs. Microelectronics Reliability, 55(9-10):1692-1696, 2015. [doi]

Abstract

Abstract is missing.