Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems - researchr publication authors

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Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra. Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 135-140, IEEE Computer Society, 2004. [doi]

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