Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra. Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 135-140, IEEE Computer Society, 2004. [doi]
@inproceedings{RossiMNKM04,
title = {Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems},
author = {Daniele Rossi and A. Muccio and André K. Nieuwland and Atul Katoch and Cecilia Metra},
year = {2004},
doi = {10.1109/IOLTS.2004.26},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.26},
tags = {reliability},
researchr = {https://researchr.org/publication/RossiMNKM04},
cites = {0},
citedby = {0},
pages = {135-140},
booktitle = {10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal},
publisher = {IEEE Computer Society},
isbn = {0-7695-2180-0},
}