Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella. Impact of Aging Phenomena on Soft Error Susceptibility. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 18-24, IEEE, 2011. [doi]
Abstract is missing.