Lucio Rossi, M. Riccio, E. Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito. A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing. Microelectronics Reliability, 50(9-11):1479-1483, 2010. [doi]
@article{RossiRNIBS10,
title = {A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing},
author = {Lucio Rossi and M. Riccio and E. Napoli and Andrea Irace and Giovanni Breglio and Paolo Spirito},
year = {2010},
doi = {10.1016/j.microrel.2010.07.080},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.080},
tags = {testing},
researchr = {https://researchr.org/publication/RossiRNIBS10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1479-1483},
}