Deep Bayesian Active Semi-Supervised Learning

Matthias Rottmann, Karsten Kahl, Hanno Gottschalk. Deep Bayesian Active Semi-Supervised Learning. In M. Arif Wani, Mehmed Kantardzic, Moamar Sayed Mouchaweh, João Gama, Edwin Lughofer, editors, 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018. pages 158-164, IEEE, 2018. [doi]

@inproceedings{RottmannKG18,
  title = {Deep Bayesian Active Semi-Supervised Learning},
  author = {Matthias Rottmann and Karsten Kahl and Hanno Gottschalk},
  year = {2018},
  doi = {10.1109/ICMLA.2018.00031},
  url = {https://doi.org/10.1109/ICMLA.2018.00031},
  researchr = {https://researchr.org/publication/RottmannKG18},
  cites = {0},
  citedby = {0},
  pages = {158-164},
  booktitle = {17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018},
  editor = {M. Arif Wani and Mehmed Kantardzic and Moamar Sayed Mouchaweh and João Gama and Edwin Lughofer},
  publisher = {IEEE},
  isbn = {978-1-5386-6805-4},
}