Matthias Rottmann, Karsten Kahl, Hanno Gottschalk. Deep Bayesian Active Semi-Supervised Learning. In M. Arif Wani, Mehmed Kantardzic, Moamar Sayed Mouchaweh, João Gama, Edwin Lughofer, editors, 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018. pages 158-164, IEEE, 2018. [doi]
Abstract is missing.