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Multi-label Patent Classification using Attention-Aware Deep Learning Model

Arousha Haghighian Roudsari, Jafar Afshar, Charles Cheolgi Lee, Wookey Lee. Multi-label Patent Classification using Attention-Aware Deep Learning Model. In 2020 IEEE International Conference on Big Data and Smart Computing, BigComp 2020, Busan, Korea (South), February 19-22, 2020. pages 558-559, IEEE, 2020. [doi]

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