Analysis of the Pull-In Phenomenon in Microelectromechanical Varactors

Anindya Lal Roy, Anirban Bhattacharya, Ritesh Ray Chaudhuri, Tarun Kanti Bhattacharyya. Analysis of the Pull-In Phenomenon in Microelectromechanical Varactors. In Vishwani D. Agrawal, Srimat T. Chakradhar, editors, 25th International Conference on VLSI Design, VLSID 2012, Hyderabad, India, January 7-11, 2012. pages 185-190, IEEE, 2012. [doi]

@inproceedings{RoyBCB12,
  title = {Analysis of the Pull-In Phenomenon in Microelectromechanical Varactors},
  author = {Anindya Lal Roy and Anirban Bhattacharya and Ritesh Ray Chaudhuri and Tarun Kanti Bhattacharyya},
  year = {2012},
  doi = {10.1109/VLSID.2012.68},
  url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2012.68},
  researchr = {https://researchr.org/publication/RoyBCB12},
  cites = {0},
  citedby = {0},
  pages = {185-190},
  booktitle = {25th International Conference on VLSI Design, VLSID 2012, Hyderabad, India, January 7-11, 2012},
  editor = {Vishwani D. Agrawal and Srimat T. Chakradhar},
  publisher = {IEEE},
  isbn = {978-1-4673-0438-2},
}