Chanchal Kumar Roy, James R. Cordy. NICAD: Accurate Detection of Near-Miss Intentional Clones Using Flexible Pretty-Printing and Code Normalization. In René L. Krikhaar, Ralf Lämmel, Chris Verhoef, editors, The 16th IEEE International Conference on Program Comprehension, ICPC 2008, Amsterdam, The Netherlands, June 10-13, 2008. pages 172-181, IEEE Computer Society, 2008. [doi]
Abstract is missing.