Optimisation of test architecture in three-dimensional stacked integrated circuits for partial stack/complete stack using hard system-on-chips

Surajit Kumar Roy, Chandan Giri, Hafizur Rahaman. Optimisation of test architecture in three-dimensional stacked integrated circuits for partial stack/complete stack using hard system-on-chips. IET Computers & Digital Techniques, 9(5):268-274, 2015. [doi]

Abstract

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