Deep Learning Enabled Automatic Abnormal EEG Identification

Subhrajit Roy, Isabell Kiral-Kornek, Stefan Harrer. Deep Learning Enabled Automatic Abnormal EEG Identification. In 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018. pages 2756-2759, IEEE, 2018. [doi]

Authors

Subhrajit Roy

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Isabell Kiral-Kornek

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Stefan Harrer

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