Subhrajit Roy, Isabell Kiral-Kornek, Stefan Harrer. Deep Learning Enabled Automatic Abnormal EEG Identification. In 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018. pages 2756-2759, IEEE, 2018. [doi]
@inproceedings{RoyKH18, title = {Deep Learning Enabled Automatic Abnormal EEG Identification}, author = {Subhrajit Roy and Isabell Kiral-Kornek and Stefan Harrer}, year = {2018}, doi = {10.1109/EMBC.2018.8512756}, url = {https://doi.org/10.1109/EMBC.2018.8512756}, researchr = {https://researchr.org/publication/RoyKH18}, cites = {0}, citedby = {0}, pages = {2756-2759}, booktitle = {40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018}, publisher = {IEEE}, isbn = {978-1-5386-3646-6}, }