Utpal Roy, Yunpeng Li, Bicheng Zhu. Building a rigorous foundation for performance assurance assessment techniques for "smart" manufacturing systems. In Jimmy Lin, Jian Pei, Xiaohua Hu, Wo Chang, Raghunath Nambiar, Charu Aggarwal, Nick Cercone, Vasant Honavar, Jun Huan, Bamshad Mobasher, Saumyadipta Pyne, editors, 2014 IEEE International Conference on Big Data, Big Data 2014, Washington, DC, USA, October 27-30, 2014. pages 1015-1023, IEEE, 2014. [doi]
@inproceedings{RoyLZ14,
title = {Building a rigorous foundation for performance assurance assessment techniques for "smart" manufacturing systems},
author = {Utpal Roy and Yunpeng Li and Bicheng Zhu},
year = {2014},
doi = {10.1109/BigData.2014.7004335},
url = {http://dx.doi.org/10.1109/BigData.2014.7004335},
researchr = {https://researchr.org/publication/RoyLZ14},
cites = {0},
citedby = {0},
pages = {1015-1023},
booktitle = {2014 IEEE International Conference on Big Data, Big Data 2014, Washington, DC, USA, October 27-30, 2014},
editor = {Jimmy Lin and Jian Pei and Xiaohua Hu and Wo Chang and Raghunath Nambiar and Charu Aggarwal and Nick Cercone and Vasant Honavar and Jun Huan and Bamshad Mobasher and Saumyadipta Pyne},
publisher = {IEEE},
isbn = {978-1-4799-5665-4},
}